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Leica DCM8 3D Surface Metrology Microscope

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Leica Microsystems Sales GmbH

Microscopy and Histology

Ernst-Leitz-Strasse 17-37
Wetzlar, 35578
Germany

Office Phone: +49 6441 29 4099
Service Phone: +49 6441 29 4444
Fax: +49 6441 29 4013

Web: https://www.leica-microsystems.com/

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Get the best accuracy and repeatability

Whether you are working in production or research, the DCM8 delivers the accurate, repeatable metrological analysis results you need in order to optimize material performance.

Does your surface have steep slopes or complex shapes? Achieve vertical resolution up to 2 nm withHD confocal microscopy.
Is your surface smooth with micro peaks and valleys? Choose from three interferometry modes: Vertical Scanning Interferometry (VSI), Phase Shift Interferometry(PSI) or extended PSI (ePSI) for resolution of up to 0.1 nm.
If you need a quick, brilliant HD 2D image, the Leica DCM8 offers brightfield and darkfield modes.

Configurations (0)

For this microscope, no configurations are currently set up. Please contact the manufacturer or a specialist retailer of your choice for advice on your application.