Leica DCM8 3D Surface Metrology Microscope

Whether you are working in production or research, the DCM8 delivers the accurate, repeatable metrological analysis results you need in order to optimize material performance.

• Does your surface have steep slopes or complex shapes? Achieve vertical resolution up to 2 nm withHD confocal microscopy.
• Is your surface smooth with micro peaks and valleys? Choose from three interferometry modes: Vertical Scanning Interferometry (VSI), Phase Shift Interferometry(PSI) or extended PSI (ePSI) for resolution of up to 0.1 nm.
• If you need a quick, brilliant HD 2D image, the Leica DCM8 offers brightfield and darkfield modes.