Skip to the beginning of the images gallery

Nikon | IC Wafer Loader NWL200 – Advanced Wafer Loader for Inspection Microscopes

Details

Nikon | IC Wafer Loader NWL200 – Advanced Wafer Loader for Inspection Microscopes

Nikon's latest innovation, the NWL200, sets new standards in inspection technology, designed specifically for use with inspection microscopes. The NWL200 series is the first to safely handle ultra-thin wafers with a thickness of just 100 micrometers.

With its advanced clamping system, these devices ensure reliable loading processes, making them ideal for next-generation semiconductor inspections. Enhanced features, such as automatic wafer detection, reduce the risk of damage to semiconductor disks. Additionally, the integrated edge crack detection system automatically identifies defects caused by edge damage.

The NWL200 series by Nikon represents precision, safety, and innovation, offering an essential solution for modern semiconductor inspections.

Technical Data:

Category	Description
Model	NWL200
Wafer Thickness	Up to 100 micrometers
Key Features	Advanced clamping system, automatic wafer detection, edge crack detection
Application Area	Semiconductor inspection, inspection microscopes