Ryf AG | NIKON SMZ1270 / SMZ1270I for wafer inspection

Ryf AG

Bettlachstrasse 2
CH-2540 Grenchen

Schweiz/Switzerland

Tel/Phone +41 32 654 21 00
Fax +41 32 654 21 09

Mail: ryfag@ryfag.ch

WEB: https://www.ryfag.ch/

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Ryf AG | NIKON SMZ1270 / SMZ1270I for wafer inspection

 

The modular stereomicroscope NIKON SMZ1270 / SMZ1270I sets the standard for wafer inspection with its outstanding zoom factor, excellent optical performance, and versatile customization options. With a zoom ratio of 12.7:1, it offers the highest zoom factor in its class, facilitating precise inspection of wafers.


Optical Performance:


Both models, the SMZ800N and the SMZ1270, stand out with a large zoom range – 8x for the SMZ800N and an impressive 12.7x for the SMZ1270. This high magnification allows for a detailed examination of wafers to identify possible defects or irregularities. With a maximum optical magnification of 480x, the stereomicroscope provides impressive detail resolution.

Flexibility and Customization:


The ability to utilize a magnification range from 6.3x to 80x makes the NIKON SMZ1270 / SMZ1270I highly versatile for various applications in semiconductor manufacturing. The availability of different specialized objectives, including Plan Apo 0.5x, 0.75x, 1x, 1.5x, and 2x, allows precise adaptation to different requirements and object sizes.

 

Working Distance and Ergonomics:


With a working distance of 70 mm (for a 1x objective), the stereomicroscope ensures sufficient space for handling wafers during inspection. The ergonomic operation contributes to maximizing user comfort, especially during prolonged inspection sessions.

 

Illumination Options:


The NIKON SMZ1270 / SMZ1270I offers various specialized light sources that ensure optimal illumination for a wide range of objects, including wafers. Proper lighting is crucial for the accurate inspection of surface structures and irregularities.

 

Modularity and Expandability:


The ability to customize ergonomic tubes, including those with a camera interface, makes the stereomicroscope particularly flexible. This modularity allows for the integration of additional features or accessories to meet individual requirements in wafer inspection.

In summary, the NIKON SMZ1270 / SMZ1270I stereomicroscope provides a powerful and flexible solution for wafer inspection by combining high magnifications, precise customization options, and ergonomic design.

 

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